离子探针样品靶的制备问题探讨

A Discussion on the Sample Preparation for SIMS Analysis

离子探针(二次离子质谱仪)是现今地质研究重要的技术手段,适宜样品靶的制备是进行离子探针样品测试的基础。受仪器样品靶托的限制,离子探针常规样品靶直径为1in(约2.54cm)(也有其他规格,需具体咨询),厚度不超过5mm的圆靶。在此前提下,针对样品种类和分析目的不同,样品靶制备过程中需要考虑的因素包括样品靶材质、样品固定方法、抛光材料、抛光程度、标准样品摆放等。依据不同测试需求,本文详细介绍了地学原位微区分析中常见的样品预处理流程,如分离出的单矿物、光薄片、岩石手标本等,并针对存在的问题进行详细论述。

The Secondary Ion Mass Spectrometry (SIMS)in-situ micro-analysis is one of the most indispensable tools in various geological researches.The preparation of suitable sample mounts for SIMS analysis is the prerequisite for obtaining qualified analytical results.The sample mount of the SIMS is constrained by the instrumental holder with the diameter of 1 inch (2.54cm)and thickness of less than 5mm.On the basis of this premise,various factors including materials of sample mount,sample grain fixation methods,polishing materials,polishing quality,and the placement of reference materials should be considered for different types of samples and different purposes of analysis:Regarding to various sample preparation associated issues,such as separated mineral grains,thin sections,and rock specimen,which are,and various requirements of analysis,this paper has respectively introduced various procedures of the sample preparation and systematically discussed various existing problems commonly accounted in sample preparation for the in situ microanalysis in geoscience.