摘要
Two-dimensional(2D)materials distinguish themselves by high specific surface areas and wide tunability in nanophotonics research.As the developing of 2D materials optical and opto-electronic investigations,scanning probe microscopy provides high spatial resolution and strong local field confinement,which can realize the single molecular and atomic level of characterization.Here,we review the nanophotonic and opto-electronic features of both pristine and hybrid 2Dmaterials which are measured by scanning probe microscopy.The conclusion and prospective of scanning probe techniques for the future2Dmaterials characterization and practical applications are presented.
Two-dimensional(2 D)materials distinguish themselves by high specific surface areas and wide tunability in nanophotonics research.As the developing of 2 D materials optical and opto-electronic investigations,scanning probe microscopy provides high spatial resolution and strong local field confinement,which can realize the single molecular and atomic level of characterization.Here,we review the nanophotonic and opto-electronic features of both pristine and hybrid 2 Dmaterials which are measured by scanning probe microscopy.The conclusion and prospective of scanning probe techniques for the future2 Dmaterials characterization and practical applications are presented.
作者
池骋
方哲宇
CHI Cheng;FANG ZheYu
基金
supported by the National Key Research and Development Program of China(Grant No.2017YFA0205700)
National Basic Research Program of China(Grant Nos.2015CB932403&2017YFA0206000)
National Natural Science Foundation of China(Grant Nos.11674012,61422501,11374023and 61521004)
Foundation for the Author of National Excellent Doctoral Dissertation of China(Grant No.201420)
National Program for Support of Top-notch Young Professionals(Grant No.W02070003)
