基于电流测试的SoC量产测试方法研究

Research on SoC Mass Production Test Method Based on Current Test

通过对一款以ARM处理器为内核,外围模块包括SRAM、Flash、CAN、I2C等通信模块的车载系统级芯片(SoC)的分析,结合静态电流、动态电流、IDDQ测试项目测试速度快、硬件资源要求不高的优点,替换了SoC部分功能测试项目,节约了测试时间,达到了在保证测试质量的前提下,节省测试成本的目的。

Through an analysis of the on-board system-on-chip (SoC)with ARM processor as the core and peripheral modules including SRAM,Flash,CAN,I2C and other communication modules,combined with,the advantages of test speed and low hardware resource requirements of quiescent current dynamic current,IDDQ current have replaced some of the functional test items,saving test time and achieving the goal of saving test costs under the premise of ensuring test quality.