摘要
目前矿石中低含量钨的测定方法一般采用分光光度法以及ICP-AES法,随着分析技术手段的不断开发创新,ICP-MS法在痕量分析领域上优势明显。本文利用ICP-MS高分辨率、高灵敏度、低检测限、快速分析等优点,建立一种新的仪器分析检测方法,满足工业生产中对于钽铌矿中低含量杂质元素钨快速分析的要求,优于现行的行业标准制定的分析方法。经检验,ICP-MS法的分析结果准确、可靠,可在实际中应用。
Currently,spectrophotometry method and ICP-AES method are generally used to determine low content tungsten in ores .With the continuous development and innovation of analytical techniques,ICP- MS method has obvious advantages in the field of trace analysis.In this paper,ICP-MS as a new instrument analysis and detection method with the advantages of high-resolution,high sensitivity,low detection limit and rapid analysis is established to meet the requirements of rapid analysis of low content tungsten in tantalum-niobium ores in industrial production,which is superior to current analytical methods developed by industry standards.After testing,the analytical results of ICP-AES are accurate and reliable,and can be applied in practice.
作者
吴卓葵
黄双
WU Zhuo-kui;HUANG Shuang(Guangdong Rising Rare Metals-EO Materials Ltd,Conghua 510900,China)
出处
《稀有金属与硬质合金》
CAS
CSCD
北大核心
2019年第1期80-82,共3页
Rare Metals and Cemented Carbides
关键词
ICP-MS
钽铌矿
钨
分析检测
应用
ICP-MS
tantalum-niobium ores
tungsten
analysis and detection
application
