一种红外焦平面非均匀性校正改进方法的研究

Research of Improving the Non-uniformity Correction in IRFPAs

微测辐射热计吸收入射红外辐射 ,引起读出电路输出信号的非均匀性。由于非均匀性校正的局限性 ,以前的微测辐射热计需要对基底温度进行精确控制。文中在两点校正法的基础上 ,提出了偏置校正法 ,可以放松对基底温度控制的要求。在常规两点增益与补偿校正法基础上 ,采用偏置校正 ,可在更宽的基底温度范围内进行非均匀性校正。这样的话 。

Microbolometer absorbs infrared radaition, and causes nonuniformity of signal in the readout circuit. Because of the limitation of non uniformity correction, former microbolometer needed to control substrate temperature accurately. On the basis of two point correcting method, bias correcting method is presended, which may relax the requisition of the substrate temperature of control. Bias correcting method followed by routine gain and compensate two point correcting method will be effective in a wider range of substrate temperature. In this way, the temperature control in the readout circuit will be possible.