大气单颗粒物中无机元素的二次离子质谱研究

Analysis of Inorganic Elements of Individual Particle in Urban Aerosol Using Secondary Ion Mass Spectroscopy

采用飞行时间式二次离子质谱对大气单颗粒物 ( 2 0μm以下 )进行了探索性研究 ,并用硅片、铜片、镀银铜片和镀金铜片作为分析基片进行了对比实验 ;对以镀金铜片基片得到的谱图进行了金属元素分析 ,并与相同样品总颗粒物的 ICP- AES分析结果进行了比较 .结果表明 :镀金铜片基片的分析效果最佳 ;ICP- AES检测出的金属元素除 Cd外 ,在二次离子质谱图上均有体现 .因此 ,单颗粒物含有总颗粒物的“指纹”

The individual particle (smaller than 20 μ) in urban aerosol was researched by SIMS (Secondary Ion Mass Spectroscopy). Plates of silicon, copper, silver plated copper, and gold-plated copper were tested. The spectrum of gold-plated copper plate was analyzed for inorganic elements, and the result was compared with that of ICP-AES analysis for the sample of bulk particles. The comparison shows that the gold-plated copper plate is the best one for analysis; all the elements but Cd determined by ICP-AES are also found in the SIMS spectrum. Therefore, the individual particle contains the 'finger-print' information of the bulk particles.