摘要
对 n型源区、p型势垒区和具有 δ(p+ )薄层势垒区的两种结构 BRAQWET的能带模型 ,作了严格的定量分析 ,由此可以导出设计良好器件的优化参量。这是设计
A quantitative analysis of band structure about BRAQWET, which has two kinds of device structure, n reservoir p barrier and n reservoir n barrier with δ(p +) layer, was presented in this paper. Some optimum parameters, therefore, were derived. This is a theoretical basis of designed BRAQWET.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
2002年第1期25-28,共4页
Research & Progress of SSE
基金
国家自然科学基金 (No.693 70 0 1)
德国德意志科学联合会 (DF G)(No.44 6CHV-113 /74/0 )资助项目