CMOS器件自锁现象的探讨

Discussion of the SCR phenomenon of CMOS chip

结合最近开发的绝缘油耐压测试仪中出现的CMOS自锁现象,系统分析了在电路设计中尤其是强电磁场等特殊环境下普遍存在的CMOS器件自锁现象产生的机理、触发条件和原因,并提出了抑制该类干扰的各种措施。

This article analyses the SCR phenomenon of CMOS chip, when designing the testinginstrumentation of the dielectric oil broken-down voltage, and brought forward the means to avoidthe occurrence of SCR.