针对玻璃基片石英试杆影响的磁光薄膜磁性参数的估算方法

An Estimating Method of Magnetic Parameters for Magneto-optical Thin Films Under the Influence of Glass Slide and Quartz Holder

对于直接重写磁光记录薄膜的磁性测量,实际测得的磁滞回线是磁光薄膜与玻璃基片和石英试杆共同作用的结果,不能由此图直接确定基本的磁性参数。根据磁光薄膜的曲线和玻璃基片与石英试杆的曲线之间的特点,提出一种简单有效的方法快速直接确定基本的磁性参数。

If magnetization of substrate and quartz holder distorts the hysteresis loop of magneto optical films, it is impossible in general that magnetic parameters of them are estimated directly. But this paper presents an effective and fast method for direct determination of magnetic parameters.