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微型激光干涉仪应用于纳米测量机 被引量:7

Miniature Laser Interferometers Applied to Nano-Measuring Machine
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摘要 本文介绍德国SIOS公司的微型激光干涉仪在德国Ilmenau技术大学纳米测量机 (NMM )研制过程中的应用。简要介绍微型激光干涉仪的工作原理 ,重点论述NMM如何在 2 5mmx 2 5mmx 5mm的空间范围内实现分辨力为 1.
出处 《计量技术》 2002年第4期6-8,共3页 Measurement Technique
基金 教育部重点科技项目 990 2 2
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参考文献5

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  • 2[2]"Mike Holmesa, Robert Hocken, David Trumper, The long-range scanning stage: a novel platform for scanned-probe microscopy, Precision Engineering, 24 (2000) 191-209
  • 3[3]"Kiyoshi Takamasu, Satoshi Ozawa, Takayuki Asano, Akihiro Suzuki, Ryoshu Furutani and Shigeo Ozono, Basic Concepts of Nano-CMM (Coordinate Measuring Machine with Nanometer Resolution), 1996 The Japan-China Bilateral Symposium on Advanced Manufacturing Engineering
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同被引文献51

  • 1齐永岳,赵美蓉,林玉池.纳米测量系统的研究现状与展望[J].仪器仪表学报,2003,24(z1):91-94. 被引量:16
  • 2黎永前,朱名铨.光干涉技术在纳米精度测量中的应用及发展[J].航空精密制造技术,2002,38(2):32-36. 被引量:4
  • 3陈本永,李达成.纳米测量技术的挑战与机遇[J].仪器仪表学报,2005,26(5):547-550. 被引量:21
  • 4冯斌,王建华.表面形貌光学法测量技术[J].计量与测试技术,2005,32(6):4-6. 被引量:7
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