期刊文献+

零蠕变法测量固-固相界面能研究 被引量:2

A Study of Determination of Solid-Solid Interfacial Energies by Zero Creep Measurements
下载PDF
导出
摘要 金属多层膜在高温低应力条件下发生弹性蠕变时,由于膜的塑性流动,使得测量金属固固相界面能成为可能。介绍了一种测量金属固-固相界面能的方法——零蠕变法,并着重阐述双向零蠕变法的原理和设备。 Metal multilayers deform by elastic creep under the condition of high temperature and low stress. Metal solid-solid interfacial energies can be determined when plastic flow is possible in the multilayers.Therefore,a new method named Zero Creep Measurements has been introduced to measure the interfacial energies.The principle and devices for Biaxial Zero Creep Measurements are emphatically described.
出处 《材料导报》 EI CAS CSCD 2002年第4期19-21,共3页 Materials Reports
基金 国家自然科学基金(59971021)
关键词 测量 固-固相界面 界面能 零蠕变法 金属多层膜 激光曲率法 界面张力 弹性为 interfacial energies,zero creep measurements .multilayer,laser curvature measurements
  • 相关文献

参考文献8

  • 1赫茨伯格R W.工程材料变形与断裂力学.北京:机械工业出版社,1982.167
  • 2Udin H,Shaler A J,Wulff J. Metall Trans AIME, 1949,185:186
  • 3Josell D,Spaepen F. Acta Metall Mater, 1993,41 (10):3007
  • 4Josell D,Spaepen F. Acta Metall Mater, 1993,41 (10):3017
  • 5Josell D. Acta Metall Mater,1994,42(3),1031
  • 6Flinn P A,Gardner D S,Nix W D. IEEE Trans Electron Devices, 1987,ED-43(3): 689
  • 7Pan J T,Blech I. J Appl Phys,1984,55(8):2874
  • 8Brucker W,Sobe G ,et al. Thin Solid Films, 1995,261: 90

同被引文献26

  • 1Ru C. Q. Department of Mechanical Engineering, University of Alberta, Edmonton, Alberta, Canada T6G 2G8.Simple geometrical explanation of Gurtin-Murdoch model of surface elasticity with clarification of its related versions[J].Science China(Physics,Mechanics & Astronomy),2010,53(3):536-544. 被引量:15
  • 2黄丹,陶伟明,郭乙木.分子动力学模拟纳米镍单晶的表面效应[J].固体力学学报,2005,26(2):241-244. 被引量:7
  • 3黄殿武,连媛,李凯.非线性弹性薄膜表面效应的尺寸相关性研究[J].中国工程科学,2006,8(4):54-59. 被引量:3
  • 4H J Frost, M F Ashby. Deformation-Mechanisms Maps [ M ].Peragmon Press, Oxford, 1982.
  • 5R W Hertzberg. Deformation and Fracture Mechanics of Engineering Materials[M]. John Wiley & Sons. Inc , 1996, Chapter 5,157 -210.
  • 6M D Thouless. Modeling the Development and Relaxation of Stresses in Films[ J]. Annu Rev Mater Sci, 1995,25:69 - 96.
  • 7M D Thouless, J Gupta, J M E Harper Stress Development and Realxation in Copper Films during Thermal Cycling [ J]. J Mater Res , 1993,8(8) : 1845 - 1852.
  • 8P A Flinn, D S Gardner, W D Nix. Measurement and Interpretation of Stress in Aluminum-based Metallization as a Function of Thermal History[ J]. IEEE Trans Electron Dev , 1987,ED34(3) : 689 - 699.
  • 9D Josell. Interfacial Free Energies form Substrate Curvature Measurements of the Creep of Muhilayer Thin Films [ J ]. Acta Metall Mater , 1994,42(3) : 1031 - 1038.
  • 10D Josell, F Spaepen. Determination of the Interracial Tension by Zero Creep Experiments on Mulfilayers- Ⅱ . Experiment [ J ]. Acta Metall Mater , 1993,41 (10) : 3017 - 3027.

引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部