摘要
采用俄歇能谱技术分析了铂层厚度,合金温度及表面染色对铂化硅形成的影响,并分析了王水对铂化硅的作用,给出了分析结果。
In this paper , the influences of various parameters , such as Pt thickness alloyingtemperature and surface dyeing , on forming platinum silicide and the action of aqua regia on Ptsilicide were analyzed with AES. The result is given .
出处
《半导体技术》
CAS
CSCD
北大核心
2002年第5期73-76,共4页
Semiconductor Technology