摘要
本文介绍了利用现有5μm工艺设备进行1~2μm窄条的光刻技术,着重对光刻SiO_2窄条和金属连线方面作了具体的介绍。对优化的“发射区两次错位光刻”和“多晶发射极自对准”工艺技术作了较详细的叙述。
A technique for the fabrication of 1-2μm lines using equipment of capability is described. With this technique, SiO2 lines and metal connections ;are processed. The optimized 'Two Step Emitter Displacement Masking' and 'Polysilicon Emitter Self Alignment' techniques are detailed.
出处
《微电子学》
CAS
CSCD
1991年第6期56-59,共4页
Microelectronics
关键词
半导体器件
光刻
工艺
设备
Resolution, Photolithography, Semiconductor process