一种测定晶体取向及其分布的简便XRD方法

A Simple XRD Method for Determining Crystal Orientation and ItsDistribution

提出了旋转定向测试法,其原理是使试样在粉末Ｘ射线衍射仪上进行θ扫描的同时绕其端面法线自转,增加了晶面法线通过衍射平面的机会．通过这种方法可直观地区分取向多晶、准单晶或者单晶体,评定研制过程中准单晶和择优取向材料的晶体品质;确定单晶、准单晶及择优取向等材料的晶面相对宏观端面的晶向偏离角和取向分散度;还可对单晶体材料进行三维晶面定向．旋转定向法测试晶体取向具有快速简便、一机多用、精度高等优点,在电子、光学、磁性、机械等材料研究领域具有广泛的应用．

The principle of Rotating specimen for determining crystal Orientation XRD (RO-XRD) testing method presented in this paper is rotating the specimen along its surface normal axle during the theta scanning to increase the chances for the normal axle of a crystal plane to cross the diffraction plane on a powder X-ray diffractionmeter. Orientated polycrystal, quasi-single crystal or single-crystal materials can be easily distinguished, and the crystal quality of quasi-single and orientated crystal materials in processing can be picturesquely assessed by this method. The deviation angle of the crystal plane from the macro surface and the scattering degree of the crystal orientation of single crystal, quasi single crystal and orientated crystal materials can be measured, which makes it possible to define the three dimensional crystal plane directions of a single crystal material by this method. The RO-XRD method is simple, quick, adaptable and precise for measuring crystal orientation, therefore, it has wide potential applications in the fields related to electronic, optical, magnetic materials and engineering materials.