摘要
无箔二极管中电子回流是造成绝缘子表面闪络的重要因素 ,用Maxwell方程和电子运动方程定性分析了电子束回流的可能性 ,采用PIC方法模拟了无箔二极管中电子束回流的物理过程 ,由此提出了对引导磁场和阴阳极结构进行优化设计的建议。
The reflux is one of the main factors to cause the dielectric surface flashover. The possibility of producing the reflux is analyzed by the use of Maxwell equations and electron motion equations. Then the PIC method is used to simulate the production process of the e beam electrons reflux in foil-less diode and some simulation results are presented. Finally some suggestions are given for the optimum design of the diode by choosing proper guiding magnetic field and diode structure.
出处
《国防科技大学学报》
EI
CAS
CSCD
北大核心
2002年第2期101-105,共5页
Journal of National University of Defense Technology
基金
国家 8 63项目资助
