摘要
本实验采用辉光放电法制备出 a-SiP∶H 合金薄膜。用光电子能谱、电子衍射、红外光谱以及密度测试确定了合金的组成和结构。在分析了测试结果的基础上总结出:在非晶硅网络中,加入第二种合金组元 P 以后,键强及化学、结构有序度的变化对非晶合金的扩展态及带尾态起着决定作用,从而定性地解释了非晶合金光能隙、光学常数随成份的变化规律。
Electron diffraction,infrared spectra,XPS and density of a-SiP:H alloy filmsprepared by rf glow discharge decomposition of SiH_4-PH_3 mixtures have been mea-sured.Based on the analysis of above measurements,we have concluded that thevariation of bond strength and locally chemical and structural order in the amor-phous silicon matrix,when adding the second alloy element,phosphorus,in thesystem,has a definitive influence upon the localized tail states and extented bandstates.Finally,we have explained the dependence of refractive index and opticalgap on compositions of the alloys.
出处
《无机材料学报》
SCIE
EI
CAS
CSCD
北大核心
1991年第1期77-80,共4页
Journal of Inorganic Materials
基金
国家自然科学基金的资助
项目号 181231860709
关键词
硅磷合金
光学性质
非晶硅薄膜
Silicon
Optical properties
Silicon-phosphorus alloy
Amorphous silicon film