摘要
介绍了微通道板的电子增益及其测量的UV光电法 ,并着重分析了UV光透过Au薄膜引起的附加输出 (或附加增益 )对测试结果的影响 ,给出了减小的途径 。
The test theorems of UV photoelectric method and electron gain of microchannel plates were intriducde. The offects of additional output or gains caused by UV light transmimitting Au thin film on the test results were mainly analyzed. Finally, we point out the approaches decreasing the affects and propose the application prospects.
出处
《红外技术》
CSCD
北大核心
2002年第3期31-33,37,共4页
Infrared Technology
