摘要
本文使用积分宽度法同时确定了纳米CeO_2粒子的平均晶粒尺寸和晶格畸变率,讨论了使用X射线衍射数据同时计算纳米粒子的平均晶粒尺寸和晶格畸变的方法,以及应用Gaussian/Cauchy型方程进行数据处理的具体细节。研究结果说明,当计算纳米微晶的晶格畸变时,现有的一些简单计算方法可能使计算出来的晶格畸变值严重失实。
Crystalline grain size and crystal lattice distortion rate of the nano ceria sample were simultaneously determined by integral breadth method. The way to determine the above parameters based on XRD data was discussed and the details in using Gassian/Cauchy type equation for determination were presented. The results showed that the simple treating methods adopted by some authors could give a seriously deviated value when calculating the crystal lattice distortion rate of the samples with fine crystalline grains.
出处
《现代技术陶瓷》
CAS
2002年第1期34-38,共5页
Advanced Ceramics
关键词
纳米粒子
平均晶粒尺寸
晶格畸变
同时测定
X-射线衍射
积分宽度法
nanometer particles mean particle size of crystalline grain distortion of crystal lattice X-ray diffraction integral breadth method