摘要
本文主要介绍了在大规模集成电路中,必须考虑的电路测试技术的一些设计方法,同时论述了对集成电路芯片功能测试的实现以及用计算机系统对芯片测试的方法。
In this paper some design methods in which the test technology of circuit in LSI must be considered are mainly introduced. Meanwhile, it discusses the implementation of the function test of IC and the test method of IC With computer system.
出处
《西安矿业学院学报》
北大核心
1991年第1期72-77,共6页
Journal of Xi'an University of Science & Technology
关键词
集成电路
数字式
测试技术
设计
design for testability, fault model, excitation vector, response vector
