小角散射中干涉效应的消除法

Eliminating Method of Interference Effect in Small Angle X-ray Scattering

用小角散射测粒度分布 ,用的是各颗粒自身的散射强度 ,而实测的强度总包含有干涉部分 ,不易分开 ;考虑到在测非晶态的结构中 ,用的是各个原子散射光之间的干涉效应。这样就可借用非晶测量中的方法将干涉去掉 。

In small angle X ray scattering, the measurement for particle distribution was used the scattered intensity of the particle himself. But in fact the measured intensity always contained the interference effect and is difficult to separate. We consider that in measure the construction of amorphous material, was used the interference effect between the scattering beam of every atom. We can use this method of measure in amorphous to eliminate the interference effect and to take the distribution of scattering intensity of every particle himself.