摘要
提出了一个用于描述间歇模原子力显微镜扫描探针全动态工作的非线性受迫弯曲振动模型 ,这个模型考虑了一个附加于扫描探针上的质量和任意类型的探针 样品表面间的非线性相互作用力 .用参数变换和模式展开方法求得了间歇模原子力显微镜扫描探针非线性受迫弯曲振动的解 。
A new nonlinear model of the flexural driven vibration of the cantilever beam is presented as an elastic continuum system for describing the operation of the fully dynamic tapping mode Atomic Force Microscopy. This model takes into account an additional attached mass at the cantilever tip and any kind of nonlinear interaction force between the sharp sensor tip and the sample surface. By using the method of the parameter transformation and the mode expansion theorem, the partial differential equation for describing the flexural vibration of the cantilever beam is solved. Some examples of numerical simulation are given.
基金
heprojectsupportedbyKeyStateLab .ofModernAcousticsofNanjingUniversity
