摘要
研究了控制气氛载体分镏测定锰及氧化锰中锡、硅、锑、铅、铬、镁、镍、铁、铋、铝、砷、铜、锌、钛、钴等微量杂质元素的光谱方法。对载体、载气、电极形状等进行了试验选择。确定了合适的条件,根据所制定的方法进行分析,取得了满意的结果。本方法具有准确性好、测定下限低、测定元素多等优点,测定下限1×10^(-5)%—5×10^(-3)%。单次测定相对标准偏差为±8.7%—±17%。
The Speetrographic method for the determination of trace impurity elements Sn, Si, Sb, Pb, Cr, Mg, Ni, Fe, Bi, Al, As, Cu, Zn, Ti, Co et al in metal manganese by atomsphere control and carrier distillation was investigated.The anatytical conditions of the carrier, control atmosphere、electrade shape and arc current were selected and the satisfactory results was obtained.The method has the advantages of high sensitity and good accuracy.The lower determination limits are 1×10^(-5)~5×10^(-3)%and the relative standard deviation for single determination are ±8.7%~±17%.
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
1991年第5期66-71,共6页
Rare Metal Materials and Engineering
关键词
锰
杂质
元素
控制气氛光谱
测定
Manganese, Trace impurity, Spectrographic determination