金属锶中杂质的光谱测定

The Spectrographic Assay of The Impurities in Sr

本文研究了以直接光谱法测定金属锶中钡、硅、铁、镁、铅、铝、钙、铜、镉等微量杂质。对适用于光谱测定的试样形态进行了详细分析研究,对测定条件进行了试验选择,为金属锶的纯度分析建立了测定方法。本方法操作简便,稳定性好。测定下限为0.01%—0.005%。

A direct emission spectrographic Method is used for determing the trace elements Ba,Si,Fe,Mg,Pb,Al,Ca,Cu dnd Cd in metal strotium.A method of determination of the purity of strontium was established through analyzing different states of the samples which can be applicable to emission spectrographic method and selecting the analytical conditions. The method has the advantages of simple operation and high stability.The lower determinition limits are 0.01—0.0005%.