摘要
人工智能技术的发展为目前自动测试系统存在的问题提供了一种新的解决方法。本文首先介绍现有自动测试系统存在的不足;然后讨论人工智能技术在用于监控的自动测试系统——BIT装置中的不同应用类型和基本的开发思想;最后通过描述基于规则专家系统的主要框架,分析用于维护的经验专家系统的优缺点,并在此基础上讨论集成诊断专家系统的设计思想、主要特点和当前面临的困难。
The development of artificial intelligence techniques provides a new means for solving problems occuring in current automatic testing systems. First, this paper introduces the existing drawbacks of current ATS. Secondly, it discusses some different types of applications and basic development ideas of AI in built-in test devices, which is used for monitoring the unit under test. At last, it analyzes the advantage and disadvantage of the empirical expert system used for maintenance by describing main frame of the rule-based ES, and discusses the designing ideas, system characteristics of the integrated-diagnosis ES and the difficultes encountered.
出处
《系统工程与电子技术》
EI
CSCD
1991年第2期51-55,共5页
Systems Engineering and Electronics
关键词
自动测试设备
人工智能
专家系统
ATE, UUT, BIT, Expert Systems, Integrated-Diagnosis.