纳米材料科学中的谱学研究

Spectral Analysis in Nanometer Material Science

谱学分析方法是研究纳米体系结构和性能的重要手段之一 ,对纳米材料进行深入研究离不开各种谱学方法的表征。本文综述了常用的谱学方法 ,如紫外可见光谱、红外光谱、拉曼光谱、穆斯堡尔谱、正电子湮没及光声光谱等在纳米材料研究中的最新进展。结合典型实例 ,对各种谱学方法的原理、特点以及在纳米体系研究中所能提供的重要信息进行了归纳和分析。展望了谱学分析方法在纳米科技研究中进一步的应用前景 ,以及在纳米材料研究中建立纳米尺度分辨的谱学检测方法和发展新的谱学技术等重要的发展方向。

Spectral analysis is an important means in studies of nanometer scale system, and is essential for deep understanding the structure and properties of nanometer materials. This paper reviews the recent progresses made in studies of mrionleter materials using spectral analysis methods such as UV-Visible spectroscopy, FTIR spectroscopy, Raman spectroscopy, Mossbauer spectroscopy, position annihilation and photoacoustic spectroscopy. The principle, characteristics and applications of most frequently employed spectral methods are introduced briefly and illustrated with typical examples. Future perspectives of spectral analysis in nanometer field are discussed. New directions of establishing spectral analysis methods at nanometer scale resolution and developing now spectroscopy technology in nanometer material studies are also emphasized.