摘要
针对超前进位加法器 ( CLA) ,提出了一种高效的 BIST架构。这种新的架构结合了确定性测试和伪随机测试的优点 ,并避免了各自的短处。同时 ,还提出了一个测试向量集 ,并充分利用了CLA加法器内部结构的规整性 ,向量集规模较小 ,便于片内集成。最后 。
An efficient built in self test (BIST) scheme is presented for carry look ahead (CLA) adders, which takes the advantages of both determinate test and pseudorandom test, and eliminates their disadvantages A set of test patterns is also introduced, which makes full use of the internal structure regularity of CLA adders, so that the set is relatively small in size and thus convenient for generation and integration Finally, a new method is presented for computing eigenvalue
出处
《微电子学》
CAS
CSCD
北大核心
2002年第3期195-197,共3页
Microelectronics
