单晶材料断口结晶学小面的取向测定方法

Determination of Crystallographic Facet Orientation on Fracture of Single Crystal Materials

本文论述了用X射线衍射仪和扫描电子显微镜对单晶材料断口结晶学小面的取向进行测定的方法,即图象测量标定法。

This artical describes the determination of crystallographic facet orientation on fracture of single crystal materials using X-ray diffractometer and scanning electron microscope. That is the method of photogrammetric technique determination.