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X射线衍射线形宽化时点阵参数精确测定的解卷积法

PRECISION MEASUREMENT OF CRYSTAL LATTICE PARAMETERS WITH BROADENED X-RAY DIFFRACTION LINE PROFILE ACCORDING TO THE DECONVOLUTION METHOD
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摘要 证明了在X射线衍射线形分析中如以标样衍射线形 g(x)的kα1峰位为坐标原点O解卷 ,则解得的宽化函数 f(x)的峰位恰与试样相应衍射线中kα1的位置相同。据此 ,提出一解卷积法。方法是在解卷后将标样的已准确测知kα1峰位的Bragg角 2θg 值加上 f(x)的峰位值即得出试样相应衍射线形中kα1的准确Bragg角 2θh。 It has proved that in X ray diffraction line profile analysis if deconvolution is conducted with the k α1 peak position of the standard sample line profile g(x) as the coordinate origin O the top position of the obtained broadening function f(x) is just coincident with the k α1 peak position of corresponding broadened line profile of the analysed sample h(x) . Accordingly a deconvolution method is described, wherein the accurate k α1 . Bragg angle 2 θ s of a broadened line of the measured sample is got by adding the top position value of solved f(x) to the accurately measured k α1 bragg angle 2 θ g of corresponding line of the standard sample after deconvolution. Then the precision lattice parameters of the measured sample may be calculated.
出处 《理化检验(物理分册)》 CAS 2002年第6期249-250,270,共3页 Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词 线形宽化 精确测定 X射线衍射 线形分析 点阵参数 解卷积法 金属材料 晶体分析 X ray diffraction Line profile analysis Lattice parameters Deconvolution method
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