摘要
证明了在X射线衍射线形分析中如以标样衍射线形 g(x)的kα1峰位为坐标原点O解卷 ,则解得的宽化函数 f(x)的峰位恰与试样相应衍射线中kα1的位置相同。据此 ,提出一解卷积法。方法是在解卷后将标样的已准确测知kα1峰位的Bragg角 2θg 值加上 f(x)的峰位值即得出试样相应衍射线形中kα1的准确Bragg角 2θh。
It has proved that in X ray diffraction line profile analysis if deconvolution is conducted with the k α1 peak position of the standard sample line profile g(x) as the coordinate origin O the top position of the obtained broadening function f(x) is just coincident with the k α1 peak position of corresponding broadened line profile of the analysed sample h(x) . Accordingly a deconvolution method is described, wherein the accurate k α1 . Bragg angle 2 θ s of a broadened line of the measured sample is got by adding the top position value of solved f(x) to the accurately measured k α1 bragg angle 2 θ g of corresponding line of the standard sample after deconvolution. Then the precision lattice parameters of the measured sample may be calculated.
出处
《理化检验（物理分册）》
CAS
2002年第6期249-250,270,共3页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
