电子产品的贮存可靠性研究

Study of Storage Reliability of Electronic Products

该文研究无线电及电子产品的贮存可靠性问题 ,针对某典型无线电产品建立仿真分析的数学模型 ,进行加速寿命试验 ,以试验数据为基础建立“三大关系” ,进而完成了仿真分析 ,得出电子产品贮存失效的基本规律 ,确定电子产品的具体可靠贮存年限 。

This paper deals with electronic products' storage reliability.With regard to one typical wireless product, a simulation analysis mathematics model was worked out, an accelerated life test was done, and three relationship was created based on data out from the test. The simulation analysis has been done, the basic law of the electronic products' storage failure was obtained, a certain stable storage year of the product has been confirmed. A relationship between time of the accelerated test and that of natural storage was created. Way of the study and some important data in this paper can be used to study other normal electronic products.