期刊文献+

GaAs基异质结材料MBE生长及应用

MBE Growth of GaAs-Based Heterojunction Materials and Their Application
下载PDF
导出
摘要 对 Ga As基调制掺杂异质结材料中作为沟道层的 In Ga As的生长条件进行优化 ,并在缓冲层中嵌入LT-Ga As。功率 PHEMT器件结果为在栅长 Lg=1 .7μm时 ,跨导 gm≥ 40 0 m S/mm,BVDS>1 5 V,BVGS>1 2 V。 The growth conditions of the strained InGaAs channel with the LT GaAs buffer layer for GaAs based PHEMT have been optimized. The performance of the developed PHEMT devices with L g=1.7 μm is summarized with extrinsic transconductance g m≥400 mS/mm, BV DS >15 V,and BV GS >12 V,revealed the success in device application.
出处 《固体电子学研究与进展》 EI CAS CSCD 北大核心 2002年第2期227-230,共4页 Research & Progress of SSE
关键词 异质结材料 MBE 分子束外延 调制掺杂 晶体管 低温砷化镓 MBE modulated doping PHEMT LT GaAs
  • 相关文献

参考文献5

  • 1[1]Gourley P L, Fritz I F, Dawson L R, et al. Controversy of critical layer thickness for InGaAs/GaAs strained-layer epitaxy. Appl Phys Lett, 1988;52:377
  • 2[2]Nguyen L D, Radulescu M C, Foisy M C,et al. Influence of quantum well width on device performance of Al0.3Ga0.7As/In0.25Ga0.75As(on GaAs)MODFETs.IEEE Tran Electron Device, 1989;36:833
  • 3[3]Smith F W, Calawa A R, Chen C L,et al. New MBE buffer used to eliminate backgating in GaAs MESFETs. IEEE Electron Device Lett, 1988;9:77
  • 4[4]Chen C L, Smith F W, Clifon B J,et al.High-power-density GaAs MISFETs with a low temperature grown epitaxial layer as the insulator.IEEE Electron Device Lett, 1991;12:306
  • 5[5]Kamiska M, Webber E R, Webber Z L,et al. Stoichiometry-related defects in GaAs grown by molecular-beam epitaxy at low temperature.J Vac Sci Technol,1989;B(7):710

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部