3.3keV-27.8keV能区Cu的光电截面测量

PHOTOELECTRIC CROSS SECTIONS FOR COPPER IN THE ENERGY RANGE 3.3-27.8 keV

利用2.5MeV的质子束激发单质金属元素靶或化合物靶产生的K线或L线特征x射线作为x光源,用Si(Li)谱仪系统测得了3.3KeV—27.8keV能区Cu的x射线质量衰减系数,对于较强而孤立的特征x射线峰,衰减系数的实验误差≤1％。在本能区里,由于瑞利散射和康普顿散射的截面很小,因此,由总衰减截面扣除散射截面便得到了光电截面的实验值,与一些早期的实验结果及理论值进行了比较,并作了讨论。

X-ray attenuation coefficients have been determined for copper in the-energy range 3.3-27.8 keV. Using X rays produced by 2.5 MeV proton beam excitation of elementary targets or compound targets and Si (Li) detector system. The experimental uncertainties of attenuation coefficients have been reduced to 1% for intenser isolated characteristic X rays. The total photoelectric cross sections, obtained by subtrating scattering, have been compared with the theoretical compilations of Scofield.