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半导体集成电路用表面钝化膜的研究 被引量:3

STUDY ON SURFACE PASSIVATION FILMS FOR INTEGRATED CIRCUITS
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摘要 对于高性能高可靠性集成电路来说 ,表面钝化已成为不可缺少的工艺措施之一。本文分析了目前应用最广泛的几种无机表面钝化膜 (SiO2 、Al2 O3 和Si3 N4)的特点 ,并指出氮化硅薄膜是半导体集成电路中最具应用前景的表面钝化材料 ,发展低温的热化学气相沉积 (CVD)工艺来沉积氮化硅表面钝化膜是集成电路发展的必然趋势 ,而开发新的能满足低温沉积氮化硅薄膜的硅源、氮源前驱体是解决这一难题的有效方法 ,并对这些前驱体物质的设计原则进行了阐述。 Surface passivation is one of the essential processing for high-perfomance integrated circuits.The characteristics of existed surface passivated films for integrated circuits,such as silica,alumina,and silicon nitride films,have been reviewed and discussed in detail.Silicon nitride film has promising application for surface passivation in the large scale integrated circuits(LSI).It is an inevitable trent for LSI that chemical vapor deposition of silicon nitride film at low temperature.One of an efficient way is to develop new organic precursors as nitrogen and/or silicon sources that can deposit silicon nitride film at relative low temperature.The essential principle of the organic precursors is still expatiated on.
出处 《陶瓷学报》 CAS 2002年第2期112-115,共4页 Journal of Ceramics
关键词 半导体集成电路 表面钝化膜 研究 氮化硅 CVD 有机前驱体 陶瓷薄膜 integrated circuits,surface passivation,film,silicon nitride,CVD,organic precursor
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参考文献2

  • 1田民汉 刘德令.薄膜科学与技术手册[M].北京:机械工业出版社,1991..
  • 2邹斯洵 王季陶 等.等离子体化学气相沉积.材料表面技术及其应用[M].北京:机械工业出版社,1998..

同被引文献26

  • 1朱永法,曹立礼.氮化硅薄膜材料的表面结构和热稳定性研究[J].真空科学与技术,1995,15(1):45-52. 被引量:1
  • 2楚振生,朱永福,袁剑锋,马凯,黄锡珉.淀积条件对GD_(a)-SiN_(x)薄膜电学特性的影响[J].液晶与显示,1997,12(1):21-25. 被引量:1
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