摘要
作者用溅射法制作了银薄膜，并通过透射电子显微镜观察了银薄膜的电子显微像和 选区电子衍射环。银的晶体结构为面心立方（ｆｃｃ）晶格。我们以银薄膜作为标准样品确 定了透射电子显微镜的相机常数。
A silver thin film has been producted by sputtering process and the electron micrograph and the selected area electron diffraction pattern of the silver thin film have been observed by TEM. The cristal structure of the thin film is the fcc lattice, the camera constant L of the JTEM has been determinated for use of the silver sputtering thin film as a standard sample.
出处
《真空》
CAS
北大核心
1991年第5期12-15,共4页
Vacuum
