类镍Dy^(38+)离子的双电子复合速率研究

The dielectronic recombination coefficients of Ni-like Dy^(38+) ions

在自旋轨道劈裂阵模型 (SOSA)下 ,通过类铜组态 3d9nln′l′(n′ =4 ,5 ,6 ;l′ =s,p ,d) ,理论计算出类镍Dy38+ 的双电子复合速率系数 ,得出其在电子温度 0 0 2— 5 0keV范围内的变化规律 ,分析了不同离化度离子的能级特征 ,并分析了影响双电子复合速率系数的主要因素是相应的中间自电离态旁观电子主量子数、旁观电子角动量和电离能 。

The calculations of the rate coefficients for dielectronic recombination (DR) along the NiI isoelectronic sequence in the ground state Dy 38+ through Cu like 3d 9 n l n′l′(n,n′=4,5,6; l′ =s,p,d) inner shell excited configurations were performed using the model of spin\|orbit split array. Collisional transitions following electron capture are neglected. The trend of the DR rate coefficients was found with the change of the electronic temperature in the range of (0\^02\_5\^00)keV.The main factor which affected the DR coefficients was analyzed. This is the relative auto ionization coefficients and auto ionized energy. These will provide a new method for diagnose the parameters.