嵌入式微处理器的可测性设计技术研究

The Research of Design for Test Technology of Embedded Micropro cessor

文章介绍了一个嵌入式微处理器的可测性设计技术。根据嵌入式微处理器各个组成部件逻辑功能的特点,分别采用了内置自测试(BIST)、部分扫描(PartialScan)、边界扫描(BoundaryScan)等方法完成各个部件的可测性设计,并将符合IEEE1149.1的TAP控制器作为整个微处理器的测试控制器,达到了较优的可测性设计结果。

This paper presents the technology of design for test for an embedded microprocessor.According to the logic characteristic of different parts,It uses built-in-self-test(BIST),partial-scan and boundary scan to complete the design for test work of different parts.Additionally,It uses TAP controller that accord with the standard IEEE1149.1as the controller of the whole test of the embedded microprocessor so as to gain a good result of design for test.