二因素随机效应模型下评估X射线单晶定向系统的重复性和再现性

Assess R&R of the X-ray Orientation Determining of a Single Crystal System via the Two-way Random Effects Model

提出一种以总角度偏差作为观测数据,通过适当转换,从而方便地使用二因素随机效应模型评估X射线单晶定向测量系统重复性和再现性的方法。使用该方法安排了三组实验,分别用MINITAB计算得出了三个测试系统的重复性和再现性,并由此证明了即使在X射线单晶定向系统的校准满足要求的情况下,其测试系统的重复性和再现性也不一定满足要求,需要随时监控。

Two-way random effects model is a common method for assessing repeatability and reproducibility of measurement system, but it cannot be implemented directly because of the particularity of the X-ray orientation determining of a single crystal system. A method is put forward for conveniently calculating the Gauge R＆amp;R of the orientation determining system based on the total angle bias. Three experiments were made to compute their Gauge R＆amp;R by MINITAB. It was proved that although the measurement system has been properly calibrated, the Gauge R＆amp;R of the system is not usually in compliance with requirements, and it need to be under surveillance at any time.