磁瓦片选及自适应规格系统设计

System of Arc Magnet's Single-chip Selecting and Norm Adaptation

磁瓦缺陷人工检测效率低准确度差,由于磁瓦厚度薄且存在长度、宽度、拱高等多种规格,在进行视觉缺陷检测时难以实现磁瓦的单片准确传递。所设计的磁瓦片选系统避免了多片堆叠传递现象且能自适应不同规格。控制系统采用PLC加装数模模块和高速计数模块实现。该系统已应用于生产现场,动作准确,可靠性高,效率高。

Manual inspection has low accuracy in arc magnet＇s defects detection. Due to different norms in length, width and high arch, it＇s hard to transfer single-chip for vision defects system accurately. The single-chip selecting system is designed to avoid multi-chip arc magnets＇ stacking and transferring, and also can adapt different norms. The control system adopted PLC together with a digital-analog module and a high-speed counter module. The system has applied in production site with accurate action, high reliability and efficiency.