Y波导集成光学器件高低温储存寿命试验

High and low temperature life experiments of Y waveguide multifunctional integrated optical devices

为摸清Y波导在高低温储存环境下的薄弱环节及其寿命,通过开展高低温条件下的储存寿命试验,分阶段测试Y波导的插入损耗、分束比、尾纤偏振串音和半波电压等参数,有失效器件产生时则终止试验。对试验参数分析知,耦合区材料及结构是波导的薄弱环节。试验结果表明Y波导的插入损耗变化量≤0.45 dB;分束比变化量≤3.0%;偏振串音≤-30 dB;半波电压变化量≤1.8%,无失效器件产生。采用阿伦尼斯(Arrhenius)模型对器件寿命进行评估,Y波导集成光学器件在85℃条件下的储存寿命为18 000 h,相当于22℃下的1.6×107 h。该研究给出了Y波导长期高温储存的加速寿命和寿命评估,为其在光纤陀螺及其他传感系统中的应用提供了理论参考。

In order to make clear the storage life and weaknesses of Y waveguide multifunctional integrated optical devices at high and low temperature tests, the parameters of the insertion loss, splitting ratio, the extinction ratio and half-wave voltage were tested by carrying out high and low temperature life storage experiments. The tests continued until failure device was appeared. These tests expose two weaknesses： bad performances of the material and structure in coupling region. The tests show that the change of insertion loss ≤0.45 dB; splitting ratio variations〈3.0%; polarization crosstalk≤-30 dB; half-wave voltage variation ≤ 1.8%, and there is no failure device. Arrhenius model was used to evaluate the life of the device. The experiment results indicate that the Y waveguide can suffer the formidable conditions for 18 000 h at 85 ℃, which is equivalent to that of 1.6×10^7h at 22℃. By the Y waveguide experiments, the accelerated life and life estimate at high temperature condition are obtained, and the investigation could provide references for the applications in fiber optic gyroscopes and other sensing systems.