基于量子点荧光强度变化检测陶瓷疲劳微裂纹

Monitoring of Micro Fatigue Crack in Ceramics Based on Quantum Dots Photoluminescence

量子点具有荧光光谱窄、激发光谱宽、荧光强度高、稳定性好等优势,将量子点应用于微裂纹的监测有极大的优越性。本文利用量子点涂层的荧光性能进行了陶瓷裂纹的直接检测,并与实际裂纹比较发现仅有2%的差别;借助ANSYS有限元软件计算模拟了陶瓷在产生疲劳裂纹后的应力分布。对比发现,涂层荧光强度变化和应力变化都呈区域性分布,而且应力越大,荧光强度越强,说明该方法是一种简单有效的裂纹测试手段。

Quantum dots have narrow fluorescence wavelength and wide excitation spectrum, high luminescence intensity and long-term stability. These advantages indicate that QDs are quite suitable for crack monitoring. In this paper, the luminescence of quantum dots was applied to detect the crack happened in ceramic. The actual width of crack is close to the width detected by luminescence with an error of about 2%. The stress distribution after the emergence of fatigue crack is simulated by ANSYS. The comparison between the luminescence intensity of quantum clots and the stress are studied and both of them showed regional distribution. The luminescence intensity enhances with the increase of stress, illustrating the method is simple and effective for crack detection.