海洋环境下晶体管加速腐蚀试验中的问题探究

Problem Exploration in Accelerating Corrosion Test of Transistors in the Marine Environment

在模拟海洋环境下进行了3组不同盐溶液浓度的晶体管加速腐蚀试验,对试验样品得到的腐蚀结果进行了研究。对晶体管管壳的腐蚀速度随着浓度的增加而下降的原因进行了分析,阐述了晶体管管壳、涂层和外引线的腐蚀机理。另外,试验结果表明,晶体管外引线断裂现象依然是晶体管工艺生产过程中存在的亟需解决的问题。

In the simulated marine environment,the transistor accelerating corrosion test of three-group devious salt concentration was conducted,and then its corrosion findings were discussed.Its tube shell corrosion speed decreased with the increase of salt concentration,whose reason was also analyzed,and the corrosion mechanisms of transistor tube shell,coating and outer lead were all illuminated.Besides,the test results show the outer lead fracture is still the major problem that needs to be solved in the transistor production process.