Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level

Internal SET has become a great concern in normal radiation-hardened flip-flops with increases in frequency.We investigate the internal SET problem in the traditional hardened flip-flops in this article.We also propose a novel structure to eliminate the internal SET problem.Three-dimensional technology computer-aided design(TCAD)was adopted to verify the hardened performance of this proposed novel structure.Besides,the power and setup time were compared with the traditional hardened flip-flops.