近红外激光故障注入系统在密码芯片攻击中的应用

The Application of Near-infrared Laser Fault Injection System in Crypto-chip Attack

首先概括了当前流行的密码芯片攻击方法及优缺点,然后介绍了近红外激光故障注入系统,并详细描述了近红外激光故障注入理论、系统组成、工作原理,及实验设备与参数。以DES(data encryption standard)算法为例,通过数学推导,采用DFA(differential fault analysis)方法恢复密钥。最后,根据实验室搭建的近红外激光故障注入系统对芯片背面进行了故障攻击实验,在无任何防御措施下获取了DES算法密钥。通过实验,以及结合对有关防御方法的深入分析,展示了近红外激光故障注入攻击对密码芯片的具大威胁。

According to the advantages and disadvantages of the present popular attack methods,the near-infrared laser fault injection system is established to implement the fault injection analysis.Then,the basic theory of the near-infrared laser fault injection,system structure,work principle,experiment devices and parameters,are described.And the DES （data encryption standard） algorithm is exampled for introducing how to use the differential fault analysis method to retrieve the key by mathematical deduced.Finally,the near-infrared laser fault injection system,which is established by our lab,is utilized to perform the attack experiment on the back side of the security chip,and the DES algorithm key is obtained without any countermeasures.Combined with the deep analysis for the relation countermeasures,this experiment shows the powerful threat which comes from the near-inflared laser fault injection attack.