期刊文献+

6H-SiC晶片集群磁流变研磨工艺优化 被引量:1

Optimization of lapping technology based on cluster magnetorheological effect for 6H-SiC wafers
下载PDF
导出
摘要 为了研究不同种类磨粒与羰基铁粉的粒径匹配性对加工效果的影响规律,并优化磁感应强度、研磨压力、研磨盘转速和工件转速等工艺参数,采用集群磁流变研磨方法对6H-SiC晶片进行了研磨试验。结果表明:当磨粒与羰基铁粉的粒径比约为1.5时加工效果较好;各工艺参数对6H-SiC加工的材料去除率的影响由大到小依次为磁感应强度、研磨盘转速、研磨压力、工件转速,对表面粗糙度的影响由大到小依次为磁感应强度、研磨压力、工件转速、研磨盘转速;磁感应强度可以改变羰基铁粉的吸附力,从而改变对磨粒的把持程度,成为影响加工效果最显著的因素。优化后的工艺参数组合为:工件转速60r·min-1;研磨盘逆向转速90r·min-1;研磨压力70kPa;磁感应强度0.012T。在此优化条件下能获得最大的材料去除率(0.498μm·min-1)和较低的表面粗糙度(86.3nm)。 To study the diameter matching influence principle of particle size of abrasives and carbonyl iron powder to process, and optimize the parameters including of magnetic field strength, lapping pressure, plate speed and workpiece speed, the experiments based on cluster magnetorheological effect for single〉crystal 6H-SiC wafers were conducted. The experimental results showed that, the best process effect could be obtained when the diameter ratio of abrasive to carbonyl iron powder is about 1.5. The im portant order from big to small of relevant factors that affect the lapping efficiency is magnetic field strength, plate speed, lapping pressure and workpiece speed. The order from big to small for surface roughness Ra value is magnetic field strength, lapping pressure, workpiece speed and plate speed. Due to the control to abrasives by carbonyl iron powder, magnetic field strength is the main factor of process effects. The optimized process parameters are workpiece speed of 60 r ~ min 1, plate reverse speed of 90 r ·min^-1, lapping pressure of 70 kPa, magnetic field strength of 0. 012 T. A maximum material removal rate of 0. 498 μ.m · min^-1 and a surface roughness Ra value of 86.3 nm can be obtained under the optimized condition.
出处 《中国科技论文》 CAS 北大核心 2014年第8期948-952,共5页 China Sciencepaper
基金 国家自然科学基金资助项目(U1034006 51305082 51375097) 高等学校博士学科点专项科研基金资助项目(20134420110001)
关键词 集群磁流变效应 研磨 6H-SiC晶片 粒径匹配 工艺优化 cluster magnetorheological effect lapping 6H-SiC wafer diameter match parameters optimization
  • 相关文献

参考文献14

  • 1Casady J B, Johnson R W. Status of silicon carbide (SIC) as a wide-band gap semiconductor for high-tem perature applications: A review [J]. Solid-State Elec- tronics, 1996, 39(10).- 1409 1422.
  • 2Siergiej R R, Clarke R C, Sriram S, et al. Advances in SiC materials and devices: An industrial point of view [J]. Materials Science and Engineering.. B, 1999, 61/ 62 .. 9 17.
  • 3Chen Wai-Kai. The VLSI Handbook [M]. Boca Raton, USA: CRC Press, 1999.
  • 4Yashiro H, Fujimoto T, Ohtani N, et al. Development of lapping and polishing technologies of 4H SiC wafers for power device applications [J]. Materials Science Fo- rum, 2009, 600/601/602/603: 819-822.
  • 5李娟,陈秀芳,马德营,姜守振,李现祥,王丽,董捷,胡小波,徐现刚,王继扬,蒋民华.SiC单晶片的超精密加工[J].功能材料,2006,37(1):70-72. 被引量:21
  • 6赵树峰,陈治明,潘盼,王欢欢.SiC单晶片的取向研磨[J].人工晶体学报,2010,39(2):365-368. 被引量:3
  • 7Su Jianxiu, Liu Xinglong, Zhang Zhuqing, et al. Influ- ence of lapping parameters on 6H-SiC crystal substrate (0001) C surface based on diamond particle [J]. Ad- vanced Materials Research, 2012, 565.. 237-242.
  • 8Li Wei, Yan Qiusheng, Lu Jiabin, et al. Effect of abra-sives on the lapping performance of 6H-SiC single crys- tal wafer [J]. Advanced Materials Research, 2013, 690-693.. 2179 2184.
  • 9胡海明,李淑娟,高晓春,李言.SiC单晶片研磨过程材料去除率仿真与试验研究[J].兵工学报,2013,34(9):1125-1131. 被引量:9
  • 10Jain V K, Ranjan P, Suri V K, et al. Chemo-mechani cal magneto-rheological finishing (CMMRF) of silicon for microelectronics applications [J]. CIRP Annals: Manufacturing Technology, 2010, 59(1): 323-328.

二级参考文献35

共引文献45

同被引文献8

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部