期刊文献+

Effects of Pretreatment on the Electronic Properties of Plasma Enhanced Chemical Vapor Deposition Hetero-Epitaxial Graphene Devices

Effects of Pretreatment on the Electronic Properties of Plasma Enhanced Chemical Vapor Deposition Hetero-Epitaxial Graphene Devices
下载PDF
导出
摘要 Quasi-monolayer graphene is successfully grown by the plasma enhanced chemical vapor deposition hetero- epitaxial method we reported previously. To measure its electrical properties, the prepared graphene is fabricated into Hall ball shaped devices by the routine micro-fabrication method. However, impurity molecules adsorbed onto the graphene surface will impose considerable doping effects on the one-atom-thick film materiM. Our ex- periment demonstrates that pretreatment of the device by heat radiation baking and electricM annealing can dramatically influence the doping state of the graphene and consequently modify the electricM properties. While graphene in the as-fabricated device is highly p-doped, as confirmed by the position of the Dirae point at far more than +60 V, baking treatment at temperatures around 180~C can significantly lower the doping level and reduce the conductivity. The following electricM annealing is much more efficient to desorb the extrinsic molecules, as confirmed by the in situ measurement, and as a result, further modify the doping state and electrical properties of the graphene, causing a considerable drop of the conductivity and a shifting of Dirac point from beyond 4-60 V to 0V. Quasi-monolayer graphene is successfully grown by the plasma enhanced chemical vapor deposition hetero- epitaxial method we reported previously. To measure its electrical properties, the prepared graphene is fabricated into Hall ball shaped devices by the routine micro-fabrication method. However, impurity molecules adsorbed onto the graphene surface will impose considerable doping effects on the one-atom-thick film materiM. Our ex- periment demonstrates that pretreatment of the device by heat radiation baking and electricM annealing can dramatically influence the doping state of the graphene and consequently modify the electricM properties. While graphene in the as-fabricated device is highly p-doped, as confirmed by the position of the Dirae point at far more than +60 V, baking treatment at temperatures around 180~C can significantly lower the doping level and reduce the conductivity. The following electricM annealing is much more efficient to desorb the extrinsic molecules, as confirmed by the in situ measurement, and as a result, further modify the doping state and electrical properties of the graphene, causing a considerable drop of the conductivity and a shifting of Dirac point from beyond 4-60 V to 0V.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2014年第9期137-140,共4页 中国物理快报(英文版)
  • 相关文献

参考文献26

  • 1Geim A K and Novoselov K S 2007 Nat. Mater. 6 183.
  • 2Meyer J C, Geim A K, Katsnelson M I, Novoselov K S, Booth T J and Roth S 2007 Nature 446 60.
  • 3Pisana S, Lazzeri M, Casiraghi C, Novoselov K S, Geim A K, Ferrari A C and Mauri F 2007 Nat. Mater. 6 198.
  • 4Bostwick A, Ohta T, Seyller T, Horn K and Rotenberg E 2007 Nat. Phys. 3 36.
  • 5Son Y W, Cohen M L and Louie S G 2006 Phys. Rev. Lett. 97216803.
  • 6Geim A K 2009 Science 324 1530.
  • 7Gilje S, Han S, Wang M S, Wang K L and Kaner R B 2007 Nano. Lett. 7 3394.
  • 8Novoselov K S, Geim A K, Morozov S V, Jiang D, Katsnelson M I, Grigorieva I V, Dubonos S V and Firsov A A 2005 Nature 438 197.
  • 9Firsov A A, Emtsev K V, Bostwick A, Horn K, Jobst J, Kellogg G L, Ley L, McChesney J L, Ohta T, Reshanov S A, Rohr J, Rotenberg E, Schmid A K, Waldmann D, Weber H B and Thomas S 2009 Nat. Mater. 8 203.
  • 10Berger C, Song Z M, Li X B, Wu X S, Brown N, Naud C, Mayou D, Li T B, Hass J and Marchenkov A N 2006 Science 312 1191.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部