摘要
针对纳米图像微小、难以测量和统计等难题,提出机器视觉测量算法。根据目标形状特征,引入图案匹配,设计二者相融合的纳米图像特征自动测量与统计算法。根据纳米图像的形态和面积特征,实现基于机器视觉的目标分割;并嵌入图案匹配,分析目标形状,剔除杂质干扰,解决纳米图像难以自动测量和统计的问题。仿真实验表明,该算法在纳米图像特征自动测量与统计上可以达到较好的效果。
According to the problem of nano images that they are tiny in size and difficult to measure and count, in this paper we proposed machine vision measurement operator; and according to the feature of targets' shapes, we introduced patterns matching, and designed, the au- tomatic measurement and statistics algorithm with the fusion of them two for nano images feature. Based on the morphological and area features of nano image, we implemented the machine vision-based target segmentation. Moreover, we embedded the patterns matching. By analysing the target shapes and weeding out the interference of impurity, we solved the problem of nano images in being difficult to automatically meas- ure and count. Simulation experiment demonstrated that the algorithm reached good effect in automatic measurement and counting of nano im- age feature.
出处
《计算机应用与软件》
CSCD
北大核心
2014年第9期217-220,235,共5页
Computer Applications and Software
关键词
机器视觉
图案匹配
纳米图像
自动测量
统计算法
Machine vision
Patterns matching
Nano image
Automatic measurement
Statistics algorithm