7Sergei Ostapenko,William Dallas,Denial Hess,et al.Crack detection and analyses using resonance ultrasonic vibrations in crys-talline silicon wafers[R].Photovoltaic energy conversion,Confer-ence record of the 2006 IEEE 4th world conference on volume 1,2006:920-923.
8Van Der Heidea ASH,Bultman JH.Hoomstra J,et al.Optimizing the front side metallization procems using the corescan[R].Conference record of the twenty-ninth IEEE photovoltaic specialists conference,2002:340-343.
9Trupke T,Bardos RA.Progress with luminescence imaging for the characterisation of silicon wafers and solar cells[R].22nd European Photovoltaic Solar Energy Conference,2007.
10Karsten Bothe,Peter Pohl,Jan Schmidt,et al.Electrolumines-ceflce imaging as an in-line characte rizatiOn tool for solar cell production[R].Record of the 21st European Photovoltaic Solar Energy Conference,2006:597-660.