期刊文献+

X射线衍射仪角度校准的光学新方法 被引量:2

New Optics Calibration Method for Goniometer of X-Ray Diffractometer
下载PDF
导出
摘要 目前X射线衍射仪(XRD)的角度检定和校准测试主要依据JJG 629—1989《多晶X射线衍射仪检定规程》和JB/T 9400—2010《X射线衍射仪技术条件》等技术文件,具体方法是采用光学经纬仪或多面棱体等进行测试,该测量方法实际应用中存在一定难度,其次测量间隔较大,不能很好反映真实的角度误差规律.为此,提出了利用θ角和2θ角同轴并可独立运动的特点,组合采用光电自准直仪和小角度激光干涉仪等仪器,设计了一种新的XRD的角度校准方法,它能够自动快速地连续测量角度,取k=2时,扩展不确定度约1.2″.使用该方法测试能够精确得到θ和2θ轴的误差数据,可用于修正XRD测角误差,提高XRD测试精度.该方法也适用于同步辐射等大型衍射系统等其他需要角度校准的情况. In China,the goniometer calibration for X-ray diffractometer is mainly referred to JJG 629-1989 《 Verification Regulation for Polycrystalline X-Ray Diffractometer》 and JB/T 9400-2010 《 Specification for X-Ray Diffractometer》.Optical theodolite and polygon are used to test goniometer,but these methods are complex and hard to test.So a new optics calibration method is presented,which can automatically measure the angular misalignment of the θ axis and 2θ axis with very small steps.The measuring system is composed of photoelectric autocollimator and small-angle laser interferometers,and the measure uncertainty is about 1.2 arc seconds (k =2).The whole set of angular error records obtained can be used to compensate for angular misalignment in future calculations.This method is also suited for calibrating the angular error of twin axial measure system.
出处 《天津大学学报(自然科学与工程技术版)》 EI CAS CSCD 北大核心 2014年第8期747-752,共6页 Journal of Tianjin University:Science and Technology
基金 国家自然科学基金重点资助项目(91023021) 中国计量科学研究院基本业务费资助项目(AKY0703) 自筹基本业务费资助项目(24-JB1104) 机械设计及理论浙江省重中之重学科和浙江理工大学重点实验室开放基金资助项目(ZSTUMD2012A005)
关键词 计量学 角度测量 X射线衍射 干涉测量 X射线衍射仪校准 计量校准标准 metrology angle measurement X-ray diffraction interforometer X-ray diffractometer calibration metrology and calibration standards
  • 相关文献

参考文献12

  • 1JJG629-1989多晶X射线衍射仪检定规程[S].1989.
  • 2Freiman S W, Trahey N M. Certificate: Standard Ref- erence Material 640c[S]. Gaithersburg, MD USA: National Institute of Standards and Technology, 2000.
  • 3马礼敦.X射线粉末衍射仪性能的评估[J].上海计量测试,2007,34(2):10-15. 被引量:6
  • 4Kubicek K, Braun J, Bruhns H, et al. High-precision laser-assisted absolute determination of X-ray diffraction angles[J]. Review of Scientific Instruments, 2012, 83(1) : 013102-013108.
  • 5Palermo R N, Short S M, Anderson C A, et al. De- termination of figures of merit for near-infrared and Ra- man spectrometry by net analyte signal analysis for a 4- component solid dosage system [J]. Journal of Pharmaceuticallnnovation, 2012, 7(2): 56-68.
  • 6黄银国,林玉池,王为,赵美蓉.基于互相关分析的激光自准直小角度测量技术(英文)[J].纳米技术与精密工程,2010,8(2):120-125. 被引量:5
  • 7何川,林家明,邹桂兰,任建荣,沙定国.双频激光干涉测角中角锥镜的不对称性对测角精度影响的分析[J].光学技术,2007,33(S1):289-290. 被引量:4
  • 8舒阳,邱易,羡一民.激光角度干涉仪测量精度的几个影响因素[J].工具技术,2008,42(5):72-74. 被引量:7
  • 9Siaudinyte L, Bmeas D, Rybokas M, et al. Polyno- mial error approximation of a precision angle measuring system [J]. Geodesy and Cartography, 2013, 39(1) : 7-10.
  • 10Blanton T, Huang T, Toraya H, et al. JCPDS-- international centre for diffraction data low-angle powder diffraction study of silver behenate [C]//Advances in X- Ray Analysis. USA, 1995: 99-105.

二级参考文献14

  • 1魏新武,孟卫华,刘文武.高频摆镜摆角的高精度测量[J].红外与激光工程,2008,37(S1):35-38. 被引量:4
  • 2郭筱瑛,刘晓彬.基于Fourier变换全息法的小角度测量[J].现代电子技术,2007,30(11):130-131. 被引量:1
  • 3[5]International Centre for Diffraction Data.Powder Diffraction File.Newtown Square,USA.
  • 4[6]National Institute of Standards and Technology.Certificate standard reference material 640c silicon powder,line position and line shape standard for powder diffraction.Gaithersburg,USA:2000.
  • 5[7]National Institute of Standards and Technology.Certificate standard reference material 1976,Instrument Sensitivity Standard for X-ray Powder Diffraction.Gaithersburg,USA:1991.
  • 6[8]Schreiner W N,Jenkins R.Request for comments□A reference standard for determining instrumental response for X-ray powder diffraction.Powder Diffr.1990,5(4):204~205.
  • 7[11]Blanton T N,Schreiner W N,Dann J N.JCPDS-International Centre for Diffraction Data.Statistical process control method development.Powder Diffr.1993,8(4):229~235.
  • 8[12]American Society for Quality Control.Glossary & tables for statistical quality control.Milwaukee:ASQC Quality Press,1983.
  • 9[13]Peplinski B,Wenzel J.Proficiency testing of instruments-a keyelement for quality assurance in X-ray powder diffraction.Part 1:Matching the effort to the actual needs.Mater Sci Forum.2000,321~324:144~149.
  • 10[14]Pepliuski B,Mueller R,et al.Proc EPDIC-6,Budapest/Hungary:August.1998.

共引文献18

同被引文献16

  • 1马礼敦.X射线粉末衍射仪性能的评估[J].上海计量测试,2007,34(2):10-15. 被引量:6
  • 2GOODSON SH. Challenges and strategies for patenting new solid forms[ EB/OL]. 2015 [2015 - 07 - 30 ]. http ://www. fr. com/ files/uploads/newsolidforms2, pdf.
  • 3JASCO. Raman Spectroscopy Analysis of Crystalline Polymorphs for Pharmaceutical Development [ EB/OL]. 2015 [ 2015 - 07 - 30 ]. http ://www. jascoinc, com/pharmaceutical/raman-spectros- copy-analysis-of-crystalline-polymorphs-for-pharmaceutical-devel- opment.
  • 4国家药典委员会.0451X射线衍射法[EB/OL].2015[2015-07-30].http://www.chp.org.cn/export/sites/chp/resource/2014b/2014073009473072463.pdf.
  • 5深圳万乐药业有限公司.醋酸阿比特龙的多晶型物及其制备方法:中国,200910189173.1[P].2014-03-26.
  • 6HAN J. Advances in Characterization of Pharmaceutical Hydrates [ EB/OL]. 2006 [ 2015 - 07 - 30] http ://tbiweb. org/tbi/file_ dir/TB/2006/TBI2006 _3 _25. pdf.
  • 7RANDALL CS, ROCCO WL, RICOU P. XRD in Pharmaceutical analysis: a versatile tool for problem-solving [ EB/OL ]. 2010 [ 2015 - 07 - 30]. http ://www. americanpharmaceuticalreview. com/Featured-Articles/115052-XRD-in-Pharmaeeutieal-Analysis- A -Versatile-Tool-for-Problem -Solving.
  • 8南京卡文迪许生物工程技术有限公司.达沙替尼多晶型物及其制备方法和药用组合物:中国,201110031644.3[P].2013-04-03.
  • 9中华人民共和国最高人民法院.北京嘉林药业股份有限公司、沃尼尔朗伯有限公司与中华人民共和国国家知识产权局专利复审委员会行政裁决审判监督行政判决书(2014)行提字第8号[EB/OL].2015[2015-05-05].http://www.court.gov.cn/wenshu/xiangqing-8271.htm.
  • 10XRD分析常见问题整合[EB/OL].2015[2015-07-30].http://max.book118.com/html/2013/0309/3419237.shtm.

引证文献2

二级引证文献8

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部