X射线荧光光谱法测定陶瓷、色料和釉等物料中主量及次量元素

Determination of Major and Minor Elements in Ceramic,Stain,Glaze Materials by X-Ray Fluorescence Spectrometry

采用熔融片制样用X射线荧光光谱法对陶瓷、色料和釉物料中Na,Mg,Al,Si,P,S,K,Ca,Ti,Mn,Fe,Ba,Zr,Zn,Hf 15种元素进行了测定,用理论α系数校正基体效应。方法简便、快速、分析结果的准确度完全能满足上述物料分析的要求。还用纯化学试剂和标准样品按一定比例混合制备标准样品,弥补了色料和釉缺少标准或没有标样的困难。又对Zr和Hf元素分析线进行了选择,用ZrLα和HfLβ1作为分析线,而不采用ZrKα,不仅使制备的熔片达到ZrLα线的饱和厚度,使分析结果的准确度和重现性好,而且还消除了ZrKα的谱线对HfLβ1分析线的干扰。

The contents of fifteen elements in ceramic, stain, and glaze materials, etc. , which including Na, Mg, Al, Si, P, S, K, Ca, Ti, Mn ,Fe, Ba, Zr, Hf and Zn, were determined in ceramic, stain, glaze, etc. , using X-ray fluorescence spectrometry using fusion sample preparation. The matrix effect was corrected by the theoretical coefficient α. The method is simple and rapid, and it provides better precision and accuracy when it was applied to the determine the elements in the aforementioned materials. A simulated standard sample was prepared by the mixing certain proportion of pure chemical reagent with standard samples to make up the lack of standards or standard samples of glazes and stains. At the same time, the determination lines ZrK. and HfLα, which are for Zr and Hf, were replaced by ZrLα and HfLβ1, respectively. Under the optimized conditions, not only the thickness of the fused film reached up to the saturation value of ZrL., which improved the precision and accuracy of the determination results, but also the interference of ZrKoon HfLβ1 were eliminated.