Flash型FPGA单粒子效应测试系统设计

Design of single event effect testing system on flash-based FPGA

通过分析Flash型FPGA芯片的基本结构和应用需求,设计了针对各个FPGA功能模块的试验方法,并实现了一套单粒子效应测试系统。对Actel ProASIC3系列Flash型FPGA进行单粒子翻转(SEU)、单粒子功能中断(SEFI)以及单粒子闩锁(SEL)等各类单粒子效应进行测试,并验证抗单粒子效应加固技术的有效性。测试系统包含硬件板卡设计、FPGA逻辑设计以及上位机软件设计等过程,并引入了自动测试技术优化测试流程。最终,测试系统能够满足单粒子效应试验的要求。

By analyzing the basic structure and application requirements of Flash-based FPGA chip,this paper studies the experiment method for each FPGA constitution,and build a set experiment system including hardware and software,in order to achieve a set of single-particle effects test system designed for Actel ProASIC3 FPGA series of Flash-based single-event upset （SEU）,single-particle function interrupt （SEFI） and single event latch （SEL） and other types of single-particle effects test and verify the effectiveness of anti-single Event Effects reinforcement technology.Test system includes hardware board design,FPGA logic design as well as PC software design process,and the introduction of automated testing technology to optimize the testing process.Eventually,the system is designed stable and effective to meet the further experiment requirements.