摘要
本文采用液氮冷却脆断,离子切割和超薄切片等制样手段制备高聚物样品的断面,通过扫描电镜或透射电镜观察其断面结构,提出适合维持高聚物样品断面原貌的制样方法。
The paper uses liquid nitrogen fracture,plasma cutting and thin sections and other sample preparation methods to prepare polymer cross-section sample. Section structure was observed by scanning electron microscopy and transmission electron microscopy.Sample preparation methods suitable for maintaining the original appearance of the cross-section of polymer samples was proposed.
出处
《电子显微学报》
CAS
CSCD
2014年第4期377-381,共5页
Journal of Chinese Electron Microscopy Society
基金
聚合物分子工程国家重点实验室设置的共享仪器功能与技术开发课题资助
关键词
断面
电子显微镜
高分子样品
方法
cross section
electron microscope
polymer
method
